The following automatic battery-charger design is created with a circuit that could qualify as the simplest window comparator ever built around a single transistor (see the figure). It starts charging ...
The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...
Announced at the 2017 Symposia on VLSI Technology and Circuits conference in Kyoto, Japan, IBM and its research alliance partners, GlobalFoundries and Samsung described a 5 nm transistor. This silicon ...
Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be ...