Testing is an integral and important part of any software development cycle, open or closed, and Linux kernel is no exception to that. Developer testing, integration testing, regression, and stress ...

Part four explains how to use breakpoints, event triggers, and program traces to debug code. Part six reviews the common bugs found in DSP applications, and outlines the different testing methods ...

With each turn of Moore's Law, designers at every phase in the development process are challenged with new levels of complexity. Chip designers must not only get the integrated circuit (IC) logic, ...

The first installment of this two-part series focused on debugging brushed-DC motor systems. Now the second installment will share some tips for stepper motor systems and provide general bench testing ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Modern multithreaded, asynchronous code can be hard to debug. The complexity that comes with message passing and thread management results in bugs that can seem non-determinant, with little or no way ...

Troubleshooting communications test systems can be made easier if the hardware and software development are separated from each other. Problems can be more readily found and corrected by following ...

Back in the day, we'd write some code, compile, execute, see what happened and repeat. That was testing. (Sometimes that's still what testing looks like, for better or worse.) Today, we can do a lot ...

Single die packages and products have been the norm for decades. Moreover, so has multi-chip modules (MCMs) or system in package (SiP) for quite some time. Understandably, with ASICs and SoCs becoming ...

In increasingly complex SoC designs, many of which contain multiple cores and multiple modes, determining best practices for testing and debugging is a moving target. Jason Andrews, architect at ...