Abstract: Atomic Force Microscopy (AFM) has been a broadly used platform for high-resolution imaging and mechanical characterization of a wide range of samples. However, this technique can be ...
The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...
High-quality and reliable Transmission Electron Microscopy (TEM) is an essential tool for advanced material characterization, enabling the observation of structural evolution at the atomic level under ...
A new report from the National Council on Teacher Quality has found that over 40% of US teacher preparation programs are graduating cohorts that are less diverse than their state teacher workforce.
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