Abstract: Due to scaling of semiconductors, the power density in VLSI circuits has increased dramatically. Furthermore, ON-chip power noise requirements have become more stringent as nominal voltages ...
An interactive toolbox for standardizing, validating, simulating, reducing, and exploring detailed biophysical models that can be used to reveal how morpho-electric properties map to dendritic and ...
Abstract: In this paper, the reverse drain-induced barrier lowering (RDIBL) in the negative capacitance field-effect transistor (NCFET) is discussed. It is found that the RDIBL is attributed to the ...
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