KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Tech Xplore on MSN
Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
Abstract: A large number of insulators play an important role in insulating and supporting complex power grids, and they are constantly exposed to challenges such as lightning strikes and ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback