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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
AZoOptics

Fast 3D Defect and Surface Roughness Measurement for Manufacturing Quality Control

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
IEEE

Detection of Defect Density of States in Solution-Processed Quantum Devices

Abstract: We report an electrical characterization technique to determine the defect density of states (DOS) in semiconductor nanoparticles without the interference of interface, and surface states.
IEEE

Software Defect Density Prediction based on Multiple Linear Regression

Abstract: The software quality is an indicator of the ability of a software system to function in accordance with the customer requirements. In maintaining an acceptable software quality level, defect ...