Abstract: This paper presents a DFT-IDFT-based minimum-segment calibration technique for SAR ADCs, specifically targeting capacitor mismatch-induced nonlinearity under incoherent sampling conditions.

The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...

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The AI market is growing quickly, spurring an insatiable demand for powerful AI accelerators. AI chip makers are pressed with aggressive time-to-market goals and need the tools to help them get their ...