Abstract: Defects can be regarded as targets when using a target detection algorithm. Compared with conventional targets, chip defects have distinct characteristics. Their sizes are variable, and most ...
ABSTRACT: A simple and elegant method to simulate single order reflection profile based on 1-D paracrystalline model has been proposed here. For variety of polymer films this approach has been applied ...
Abstract: Fabric defect detection is a crucial step of quality control in textile enterprises. The use of computer vision inspection technology in the textile industry is key to achieving intelligent ...
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